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Description

CDR32CRound Re Entrant Tips for 3 D imaging Max W = 32 nm, Max OH = 5 nm, Max EL = 220 nm Carbon Coated DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Round Re Entrant Tips for 3 D imaging Max Width = 32 nm Max Overhang = 5 nm Max Effective Length = 220 nm Carbon Coated Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 20 Tip Coating: Amorphous Carbon Tip Set Back( RNG): 5 15 The Aluminum reflective coating on the backside of the

The DDLTESP-V2 probe provides:

Other applications of this probe include: Scanning Capacitance Microscopy (SCM)

Proprietary Reflex Coating

Tip Geometry: Rotated (Symmetric) Tip Height: 3 - 8 Front Angle: 15+/-2 Back Angle: 25+/-2 Side Angle: 17

Scanner Calibration Grating

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 6

No Coatings

HarmoniX Training Sample for MultiMode and Dimension SPMs

Innova probe cartridge for TappingMode DESCRIPTION

-- Included with the second generation Dimension Icon and Edge EC accessories (Models ICONEC-V2-NOPOT

They are not certified or traceable to NIST

Max Overhang = 25 nm

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