Triangular Test Grating for X- or Y-axis

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Description

Triangular Test Grating for X- or Y-axisDESCRIPTION The TGT 1500 test grating is intended for SPM calibration in X or Y axis, determination of lateral and vertical scanner nonlinearity, detection of angular distortion and tip characterization. Nominal values for height and pitch are given below. Actual values come with the test grating. Structure: Si wafer with grating in top surface Pattern type: 1 D array of triangular steps with precise linear and angular dimensions Edge angle:

Hole Width 106µm

600µm Hole

easily and precisely

for an unprecedented level of resolution and force control on just about any sample

Super Sharp Conductive Single Crystal Diamond Probes

0 Front Angle: 15 ± 2

Complete with anti-static cover and polypropylene clip

Microfabricated silicon probes that are ~450 microns long and are coated with ~25 nm of PtIr conductive coating on both sides of the cantilever

Tip Geometry: Standard (Steep) Tip Height: 3 - 6 Tip Radius (Nom): <30

For even higher resolution consider the AD series of diamond probes

Tip Geometry: Pyramid Tip Height: 4

This allows you to set the tip over a point of interest on the sample