Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

SMIM-300sMIM probes, 19 kHz, 1 N m, 5 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nitride probe with shielded co axial sensor for sMIM. Nominal 18 kHz, 1 N m 5 Probes Tip Geometry: Pyramid Tip Height: 4. 5 5. 5 Front Angle: 35 1 Back Angle: 35 1 Side Angle: 35 1 Tip Radius (Nom): 50 10 Tip Coating: TiW Cantilever Material: Silicon Nitride Cantilever Thickness (Nom): 3. 6 Cantilever Thickness (RNG): 3. 3 3. 9 Cantilever Geometry: Rectangular

Al Reflective Coating

25 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive Diamond Back Side Coating: Reflective Aluminum

5+/-2 Tip Radius (Nom): 30 Tip Coating: None Tilt Compensation: 12

75 Cantilever Geometry: Rectangular Cantilevers Number: 1 Back Side Coating: Reflective Aluminum

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2

55 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtIr Back Side Coating: Reflective PtIr

Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features

moderate 0

ScanAsyst-Air-HPI Controlled Radius Tip

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RESP-20

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

5 Tip Radius (Nom): 25 Tip Coating: PtIr Tip Set Back (Nom): 9

Exchange/Return Notes