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Ultra-Flat 4" Silicon WafersDESCRIPTION Ultra Flat 4" Silicon Wafer for demanding substrate studies. Can also be used as substrate for AFM or SEM samples by dicing the wafer into smaller pieces using a Scriber and the Wafer Cleaving Glass Breaking Pliers. The 4" ultra flat silicon wafer is shipped in a 4" wafer carrier. Properties for 4" (100mm) Ultra Flat Wafer: Orientation: <100> Type Dopant: P Boron Grade: Prime CZ Virgin Resistivity: 10 20 Ohm cm Thickness: 525m + 20m TTV:

PELCO® Technical Notes: Evaluating an Analytical TEM with the NiOx Test Specimen (285kb pdf)

providing an ESD safe coating with a surface resistance of 105-106 ohm

Many laboratories use these tabs for SEM in a large diversity of applications

The Gilder grids are available in 50 to an unrivalled ultra fine 2000 mesh

Based on the measurement of 9 different standards

flat edges 1 120mm NM-SS 0

tapping and other modes with image sizes from 500nm to 20um

16502-P -Highly Polished Carbon Planchets

Can withstand up to 210°F (90°C

Scanning Thermal Microscopy probes are specially designed contact mode probes that incorporate a thin metal film near the apex of the probe

Pre-mounted on half washer mounts for easy exchange in the nanoIR head

01807 - Formvar/Carbon